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Methods for Measuring the Orientation and Rotation Rate of 3D-printed Particles in Turbulence

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Fourier analysis for rotating-element ellipsometers.

Yong Jai Cho¹, Won Chegal, Hyun Mo Cho

¹Division of Convergence Technology, Korea Research Institute of Standards and Science, 1 Doryong-Dong, Yuseong-Gu, Daejeon 305-340, South Korea. yjcho@kriss.re.kr

|January 26, 2011

Summary

We developed a new Fourier analysis for multichannel rotating-element ellipsometers. This method captures Fourier coefficients from light variations, offering broader applicability than traditional Hadamard transforms for diverse detector readouts.

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Area of Science:

Optics and Photonics
Materials Science
Spectroscopy

Background:

Multichannel rotating-element ellipsometry is crucial for material characterization.
Conventional data acquisition methods like the Hadamard transform have limitations with specific detector timing and array configurations.

Purpose of the Study:

To introduce a generalized Fourier analysis for processing periodic light-irradiance variations in multichannel rotating-element ellipsometry.
To develop a method applicable to various line arrays and readout timings, overcoming limitations of existing techniques.

Main Methods:

A discrete Fourier transform is applied to recorded exposures to obtain Fourier coefficients.
The developed analysis provides a generic function that can encompass both discrete Fourier and Hadamard transforms.
Experimental validation was performed using a custom-built rotating-polarizer ellipsometer.

Main Results:

The Fourier analysis successfully captured Fourier coefficients for a sample.
The method demonstrated applicability across different experimental conditions, including varying scan numbers, integration times, and polarizer rotation speeds.
The analysis proved more versatile than the Hadamard transform, accommodating diverse detector readout modes.

Conclusions:

The novel Fourier analysis offers a flexible and broadly applicable approach for multichannel rotating-element ellipsometry.
This method enhances data acquisition by supporting various detector configurations and readout timings.
The findings pave the way for more adaptable and efficient ellipsometric measurements in materials science and optics.