Gamma-distorted fringe image modeling and accurate gamma correction for fast phase measuring profilometry

Zhongwei Li1, Youfu Li

  • 1State Key Laboratory of Material Processing and Die & Mould Technology, Huazhong University of Science and Technology, Wuhan, China.

Optics Letters
|January 26, 2011
PubMed
Summary

This study presents a novel gamma correction method to reduce phase error in fast phase-measuring profilometry. The technique improves measurement accuracy without requiring focused fringe images, overcoming limitations of previous methods.

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