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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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Channel length scaling in graphene field-effect transistors studied with pulsed current-voltage measurements

Inanc Meric1, Cory R Dean, Andrea F Young

  • 1Department of Electrical Engineering, Columbia University , New York, New York 10027, United States.

Nano Letters
|January 29, 2011
PubMed

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