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Updated: Jun 4, 2026
10:17
20 mJ, 1 ps Yb:YAG Thin-disk Regenerative Amplifier
Published on: July 12, 2017
Note: Picosecond impulse generator driven by cascaded step recovery diode pulse shaping circuit
Gil Wong Choi1, Jin Joo Choi, Seung Hoon Han
1Department of Wireless Communications Engineering, Kwangwoon University, Wolgye-Dong, Nowon-Gu, Seoul, South Korea. roadbear@kw.ac.kr
The Review of Scientific Instruments
|February 2, 2011
Summary
This study presents a picosecond impulse generator using cascaded step recovery diodes (SRDs) to achieve shorter pulse widths. The novel design successfully reduced pulse width by 85 ps compared to conventional methods.
Area of Science:
- Electrical Engineering
- Pulsed Power Systems
Background:
- Impulse generators are crucial for various applications requiring short electrical pulses.
- Reducing the pulse width of impulse generators is a key challenge in enhancing their performance.
Purpose of the Study:
- To develop and demonstrate a picosecond impulse generator with a significantly reduced pulse width.
- To investigate the effectiveness of a cascaded step recovery diode (SRD) pulse-shaping circuit for impulse generation.
Main Methods:
- A novel pulse-shaping circuit employing cascaded step recovery diodes (SRDs) was designed and implemented.
- Time-transient circuit simulations were performed to confirm the short impulse generation.
- Experimental measurements were conducted to validate the performance of the developed generator.
Main Results:
- Numerical simulations confirmed the generation of short impulses using the cascaded SRD circuit.
- Experimental measurements demonstrated a pulse width of 250 picoseconds (ps) at 10% of the peak amplitude.
- The cascaded SRD impulse generator achieved an improvement of 85 ps compared to conventional SRD impulse generators.
Conclusions:
- The cascaded SRD pulse-shaping circuit is an effective method for reducing impulse generator pulse width.
- The developed picosecond impulse generator offers enhanced performance for applications requiring ultra-short pulses.
- This work contributes to advancements in high-speed electronic testing and measurement.
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