Related Experiment Video
Updated: Jun 4, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Measurement of x-ray spectral line wavelengths by using two bragg reflections
A V Rodé1, A M Maksimchuk, G V Sklizkov
1PN Lebedev Physical Institute, USSR.
Abstract:
A novel method of measuring absolute x-ray wavelengths using simultaneous Bragg reflections at two parallel crystal plates of equal atomic spacing is presented. The accuracy of wavelength determination Δλ/λ for this method is discussed and a value of 5 × 10-5is achieved. Absolute wavelengths of L-shell laser-produced spectra of Cu, Ge, As, and Se and M-shell spectra of Gd and Tb have been measured in the wavelength region 7.5-8.5 Å using a quartz (10T0) quasimonolithic crystal blank.
Related Concept Videos
X-ray Crystallography
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Determination of Crystal Structures
X-ray Diffraction of Biological Samples
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Spectrophotometry: Introduction
The essential components of a spectrophotometer include a source of electromagnetic radiation, a slot for placing a material to be analyzed, and a...
IR Spectrometers
Atomic Absorption Spectroscopy: Radiation and Light Sources
Two common narrow-range 'line' sources used in AAS are hollow-cathode lamps (HCLs) and...

