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Related Concept Videos

Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview01:13

Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview

Attenuated total reflectance (ATR) infrared spectroscopy is a powerful analytical technique used to study the composition of materials. It is widely employed in chemistry, materials science, forensic science, and other fields where sample characterization is required. ATR has several advantages over traditional transmission IR spectroscopy, including the requirement of little to no sample preparation and the ability to analyze a wide range of samples.
The ATR process begins by directing a beam...
Atomic Absorption Spectroscopy: Interference01:25

Atomic Absorption Spectroscopy: Interference

Interference leads to systematic error in atomic absorption (AA) measurements by enhancing or diminishing the analytical signal or the background. These interferences can be grouped into three main categories: spectral interference, chemical interference, and physical interference.
Spectral interference occurs when signals from other elements or molecules overlap with the analyte signal, falsely elevating or masking the analyte's absorbance. This interference can be corrected using Zeeman,...
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X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Interference Suppression of X-Ray Scattering under Total External Reflection from Rough Surfaces.

A Yu Karabekov1, I V Kozhevnikov, V E Fedyukovich

  • 1P. N. Lebedev Physics Institute, Academy of Sciences, Leninskii prospect 55, Moscow, Russia.

Journal of X-Ray Science and Technology
|February 11, 2011
PubMed
Summary

Destructive interference in thin films on rough substrates can significantly reduce x-ray scattering intensity. Researchers discuss the conditions required for this scattering suppression, offering insights into material analysis.

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Scattering And Absorption of Light in Planetary Regoliths
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Area of Science:

  • Physics
  • Materials Science

Background:

  • X-ray scattering is a key technique for analyzing thin film and substrate interfaces.
  • Surface roughness can complicate scattering data, making analysis challenging.

Purpose of the Study:

  • To theoretically investigate the impact of destructive interference on x-ray scattering from thin films on rough substrates.
  • To identify conditions leading to significant suppression of scattering intensity.

Main Methods:

  • Theoretical modeling of wave interference.
  • Analysis of scattering intensity based on film and substrate properties.

Main Results:

  • Destructive interference between waves scattered from the film's interfaces can cause substantial reduction in x-ray scattering intensity.
  • Suppression can be on the order of several magnitudes.

Conclusions:

  • Thin film interference offers a mechanism to suppress x-ray scattering.
  • Understanding these conditions is crucial for advanced materials characterization and data interpretation.