Interference Suppression of X-Ray Scattering under Total External Reflection from Rough Surfaces
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Updated: Jun 4, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
A Yu Karabekov1, I V Kozhevnikov, V E Fedyukovich
1P. N. Lebedev Physics Institute, Academy of Sciences, Leninskii prospect 55, Moscow, Russia.
Abstract:
Destructive interference of waves scattered from both interfaces of a thin film deposited onto a rough substrate is theoretically shown to lead to considerable suppression (up to some orders) of x-ray scattering intensity. The conditions that are necessary for the suppression of scattering are discussed.
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