Ray tracing for crystal-diffraction spectrometers with position-sensitive detectors

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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
06:46

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on: August 25, 2016

U Lehnert1, G Zschornack

  • 1Technische Universität Dresden, Fachbereich Physik, Institut für Kern- und Teilchenhysik, Pratzschwitzer Strasse 15, D-01796 Pirna, Germany.

Journal of X-Ray Science and Technology
|February 11, 2011
PubMed

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