Characterization of a Si(Li) Detector for PIXE Analysis

L Rodríguez-Fernández1, J Miranda, A Oliver

  • 1Instituto de Física, Universidad Nacional Autónoma de México, Apartado Postal 20-364, México, D.F. 01000, Mexico.

Summary

This study details the characterization of a silicon detector for particle-induced X-ray emission (PIXE) analysis. Researchers measured detector parameters and efficiency, comparing analytical and parametric models for optimal use in PIXE applications.

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