Related Experiment Video
Updated: Jun 4, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Characterization of a Si(Li) Detector for PIXE Analysis
L Rodríguez-Fernández1, J Miranda, A Oliver
1Instituto de Física, Universidad Nacional Autónoma de México, Apartado Postal 20-364, México, D.F. 01000, Mexico.
This study details the characterization of a silicon detector for particle-induced X-ray emission (PIXE) analysis. Researchers measured detector parameters and efficiency, comparing analytical and parametric models for optimal use in PIXE applications.
Area of Science:
- Nuclear Physics
- Materials Science
Background:
- Silicon detectors are crucial for elemental analysis using PIXE.
- Accurate characterization is essential for reliable PIXE results.
Purpose of the Study:
- To comprehensively characterize a silicon detector for PIXE analysis.
- To evaluate methods for determining detector parameters and efficiency.
- To compare analytical and parametric models for detector efficiency.
Main Methods:
- Characterization of a silicon detector (Si(Li)).
- Determination of main detector parameters.
- Measurement of detection efficiency (1.4-100 keV) using calibrated radioactive sources and PIXE.
- Fitting of an analytic function to efficiency data.
Main Results:
- Key parameters of the Si(Li) detector were identified.
- Detection efficiency was measured and analyzed across a broad energy range.
- Comparison of fitted parameters from different methods was performed.
- An analytic function fit to measured efficiency values was compared with a parametric form.
Conclusions:
- The study provides a detailed characterization of a Si(Li) detector for PIXE.
- Both analytical and parametric approaches to efficiency modeling offer distinct advantages.
- The findings aid in optimizing PIXE analysis through accurate detector parameterization.
Related Concept Videos
Gas Chromatography: Types of Detectors-II
Determination of Crystal Structures
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.

