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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Characterization of a Si(Li) Detector for PIXE Analysis

L Rodríguez-Fernández1, J Miranda, A Oliver

  • 1Instituto de Física, Universidad Nacional Autónoma de México, Apartado Postal 20-364, México, D.F. 01000, Mexico.

Journal of X-Ray Science and Technology
|February 11, 2011
PubMed

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