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Updated: Jun 4, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on: August 25, 2016

Multiple reflections in single crystals as a tool for x-ray spectroscopy

B S Fraenkel1

  • 1The Laboratory of X-Ray and VUV Spectroscopy, Racah Institute of Physics, The Hebrew University, Jerusalem, Israel.

Journal of X-Ray Science and Technology
|February 11, 2011
PubMed

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