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B S Fraenkel

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Journal of X-Ray Science and Technology|February 11, 2011
Multiple reflections in single crystals as a tool for x-ray spectroscopyB S Fraenkel
Journal of X-Ray Science and Technology|February 11, 2011
Focusing Properties of X-Ray Spectrometers with 2D-Curved Crystals for Extended X-Ray Sources of Hot PlasmasB S Fraenkel, M Bitter, S von Goeler, et al.
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Showing results (1-10 of 2) with videos related to

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Pageof 1
Journal of X-Ray Science and Technology|February 11, 2011
Multiple reflections in single crystals as a tool for x-ray spectroscopyB S Fraenkel
Journal of X-Ray Science and Technology|February 11, 2011
Focusing Properties of X-Ray Spectrometers with 2D-Curved Crystals for Extended X-Ray Sources of Hot PlasmasB S Fraenkel, M Bitter, S von Goeler, et al.
Pageof 1