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Sputter Growth and Characterization of Metamagnetic B2-ordered FeRh Epilayers
Published on: October 5, 2013
ReflEXAFS Spectroscopy of Thin Fe/Sc Multilayers
Y V Ponomarev1, A B Palkin, A B Savel'ev
1International Laser Center, Moscow State University, Vorobyevy Gory, 119899 Moscow.
Journal of X-Ray Science and Technology
|February 11, 2011
Abstract:
For two three-layer systems, Sc/Fe/Sc and Fe/Sc/Fe, the fine structure in specular reflected x rays above the Fe K-edge has been investigated experimentally. Computer simulation of ReflEXAFS formation on multilayered structures has been done. Estimates of each layer's thickness and density as well as of local atomic order in Fe layers have been obtained. The possibility of ultrathin-layer investigations (down to a few angstroms) has been analyzed.
