Interference and Diffraction
X-ray Crystallography
Atomic Absorption Spectroscopy: Interference
Interference: Path Lengths
Atomic Emission Spectroscopy: Interference
Interference and Superposition of Waves
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Updated: Jun 4, 2026

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
Published on: August 12, 2013
Tomoe Fukamachi1, Kenji Hirano, Riichirou Negishi
1Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293, Japan. tomoe@sit.ac.jp
Interference fringe patterns in X-ray diffraction were studied in silicon crystals. Fringe periods varied with crystal thickness and X-ray incidence, explained by dynamical diffraction theory.
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