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Updated: Jun 4, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Feasibility of in-line instruments for high-resolution inelastic X-ray scattering
1Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439, USA. wolfgang.sturhahn@jpl.nasa.gov
Abstract:
Inelastic X-ray scattering instruments in operation at third-generation synchrotron radiation facilities are based on backreflections from perfect silicon crystals. This concept reaches back to the very beginnings of high-energy-resolution X-ray spectroscopy and has several advantages but also some inherent drawbacks. In this paper an alternate path is investigated using a different concept, the `M(4) instrument'. It consists of a combination of two in-line high-resolution monochromators, focusing mirrors and collimating mirrors. Design choices and performance estimates in comparison with existing conventional inelastic X-ray scattering instruments are presented.
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