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Quantitative phase retrieval with picosecond X-ray pulses from the ATF Inverse Compton Scattering source
M Endrizzi1, T E Gureyev, P Delogu
1Dipartimento di Fisica, Universit`a di Siena, Via Roma 56, 53100 and INFN, Sezione di Pisa 56127, Italy. marco.endrizzi@pi.infn.it
Optics Express
|March 4, 2011
Summary
Quantitative phase retrieval was achieved using a novel Inverse Compton Scattering X-ray source. This technique enables picosecond-scale, phase-sensitive imaging for dynamic phenomena.
Area of Science:
- Physics
- Materials Science
- Imaging Technology
Background:
- Quantitative phase retrieval is crucial for materials characterization.
- High-speed imaging requires advanced X-ray sources.
- Current methods may lack the temporal resolution for dynamic processes.
Purpose of the Study:
- To demonstrate quantitative phase retrieval using the Inverse Compton Scattering (ICS) X-ray source at the Accelerator Test Facility (ATF).
- To assess the suitability of the ATF ICS source for picosecond-scale, phase-sensitive X-ray imaging.
- To explore the potential for imaging fast dynamic phenomena.
Main Methods:
- Utilizing an Inverse Compton Scattering X-ray source for phase-contrast imaging.
- Employing in-line geometry with single X-ray pulses of picosecond duration.
- Recovering projected sample thickness from transmitted X-ray intensity data.
Main Results:
- Successful quantitative phase retrieval was experimentally demonstrated.
- Phase-contrast images were collected with picosecond temporal resolution.
- Projected thickness of polymer samples was accurately recovered.
- Data showed good agreement with theoretical expectations.
Conclusions:
- The ATF Inverse Compton Scattering X-ray source is suitable for picosecond-scale, phase-sensitive quantitative X-ray imaging.
- The demonstrated method holds promise for quantitative imaging of rapid dynamic phenomena.
- This technique advances the field of high-resolution, time-resolved X-ray imaging.
