Related Experiment Video
Updated: Jun 3, 2026

Design, Fabrication, and Experimental Characterization of Plasmonic Photoconductive Terahertz Emitters
Published on: July 8, 2013
TE and TM beam decomposition of time-harmonic electromagnetic waves
1Department of Electrical and Computer Engineering, Ben-Gurion University of the Negev, Beer Sheva 84105, Israel. timormel@ee.bgu.ac.il
This study decomposes electromagnetic fields into transverse electric (TE) and transverse magnetic (TM) components for scattering problems. It presents new expressions for Gaussian beam propagators, aiding electromagnetic field analysis.
Area of Science:
- Electromagnetics and Optics
- Computational Electromagnetics
Background:
- Analyzing time-harmonic electromagnetic fields is crucial for scattering problems.
- Decomposition into Transverse Electric (TE) and Transverse Magnetic (TM) modes simplifies complex field analysis.
Purpose of the Study:
- To apply beam-type expansion for planar aperture time-harmonic electromagnetic field distribution.
- To decompose electromagnetic beams into TE and TM constituents for solving scattering problems.
Main Methods:
- Decomposing propagating electromagnetic beams into TE and TM field constituents.
- Describing the propagating field as a superposition of tilted and shifted TE and TM beams.
- Evaluating vector wave objects using differential operators or plane-wave spectral representations.
Main Results:
- Developed a method for applying beam-type expansion to electromagnetic fields.
- Provided explicit asymptotic expressions for scalar and electromagnetic Gaussian beam propagators.
- Enabled the application of Maxwell's boundary conditions for scattering problems.
Conclusions:
- The beam-type expansion offers an effective approach for analyzing electromagnetic fields.
- The derived expressions facilitate the study of electromagnetic wave propagation and scattering.
- This method enhances the solution of scattering problems by simplifying field decomposition.
More Related Videos
11:30Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
Published on: March 6, 2017
09:26In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on: June 26, 2015
Related Concept Videos
Transmission Electron Microscopy
Standing Waves in a Cavity
Electromagnetic Wave Equation
However, although electric and magnetic fields were first introduced as mathematical constructs to simplify the description of mutual forces between charges, a natural question emerges from Maxwell's equations: What...
Dual Nature of Electromagnetic (EM) Radiation
Wavelength is the distance between two consecutive peaks (the highest point) or troughs (the lowest point) in the wave. Frequency is the number of...
Generating Electromagnetic Radiations
Interference and Diffraction