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Related Concept Videos

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Cryo-electron Microscopy01:28

Cryo-electron Microscopy

Conventional electron microscopy (EM) involves dehydration, fixation, and staining of biological samples, which distorts the native state of biological molecules and results in several artifacts. Also, the high-energy electron beam damages the sample and makes it difficult to obtain high-resolution images. These issues can be addressed using cryo-EM, which uses frozen samples and gentler electron beams. The technique was developed by Jacques Dubochet, Joachim Frank, and Richard Henderson, for...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

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A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
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Trends in low energy electron microscopy.

M S Altman1

  • 1Department of Physics, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong.

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|March 11, 2011
PubMed
Summary

Low energy electron microscopy (LEEM) and spin-polarized LEEM (SPLEEM) offer powerful in situ surface analysis. These techniques provide real-time imaging and diffraction for studying nanostructures, magnetism, and dynamic processes with high resolution.

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Area of Science:

  • Surface science
  • Materials science
  • Condensed matter physics

Background:

  • Low energy electron microscopy (LEEM) and spin-polarized LEEM (SPLEEM) are advanced in situ techniques.
  • They are crucial for analyzing surfaces, thin films, and nanostructures.

Purpose of the Study:

  • To review the fundamental imaging principles of LEEM and SPLEEM.
  • To highlight recent advancements and novel contrast mechanisms.
  • To explore current and future applications in surface science and beyond.

Main Methods:

  • Real-time imaging
  • Diffraction capabilities
  • Analysis of electron wave nature and spin

Main Results:

  • LEEM and SPLEEM enable high spatial and temporal resolution studies.
  • Progress in instrumentation and understanding of contrast mechanisms enhances applications.
  • Demonstration of current capabilities for diverse surface analyses.

Conclusions:

  • LEEM and SPLEEM are versatile tools for in situ surface characterization.
  • Ongoing developments continue to expand their utility in nanoscience and magnetism research.
  • Future directions point towards broader applications leveraging electron properties.