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Updated: Jan 28, 2026

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
Published on: July 24, 2015
High throughput scanning μLEED imaging of surface structural heterogeneity: Defective graphene on Cu(111)
1Department of Physics, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong SAR, China.
A new tool, Source Extraction and Photometry - Spot Profile Analysis (SEP-SPA), automates analysis of scanning micro-low energy electron diffraction (μLEED) data. This enables detailed study of complex surface structures, like defective graphene on copper.
Area of Science:
- Surface Science
- Materials Science
- Nanotechnology
Background:
- Micro-low energy electron diffraction (μLEED) coupled with low energy electron microscopy (LEEM) analyzes local surface structures.
- High spatial resolution scanning μLEED provides quantitative data on structural variations.
Purpose of the Study:
- To develop a high-throughput tool for evaluating scanning μLEED data.
- To enable automated analysis of complex diffraction patterns with varying peak positions.
Main Methods:
- Development of the Source Extraction and Photometry (SEP) - Spot Profile Analysis (SPA) tool.
- Application of SEP-SPA to analyze scanning μLEED data from defective graphene on Cu(111).
Main Results:
- Automated diffraction peak identification capability demonstrated.
- Observation of a rich rotational domain structure in graphene on Cu(111).
- Identification of co-aligned graphene and domains with large rotations and small sizes.
Conclusions:
- The SEP-SPA tool facilitates high-throughput analysis of scanning μLEED data.
- The tool enables investigation of complex surface structures and domain configurations.
- Defective graphene on Cu(111) exhibits a complex rotational domain structure.
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