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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
C Joachim1, D Martrou, M Rezeq
1Centre d'Elaboration de Matériaux et d'Etudes Structurales (CEMES-CNRS) 29, rue Jeanne Marvig, BP 94347, 31055 Toulouse Cedex 4, France. Institute of Materials Research and Engineering, A*STAR (Agency for Science, Technology and Research), 3 Research Link, 117602, Singapore.
Connecting atomic-scale circuits to multiple electrodes presents challenges. This study explores laboratory-scale machines using microscopy techniques for precise interconnections on different materials.
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