Metal-Semiconductor Junctions
Biasing of Metal-Semiconductor Junctions
Metallic Solids
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Updated: Jan 18, 2026

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Published on: November 22, 2021
1Department of Physics, Tsinghua University, Beijing, People's Republic of China. wangyd05@mails.tsinghua.edu.cn
This study reveals two types of dislocations in metal/silicon carbide (SiC) interfaces. Some interfaces exhibit partial dislocations, leading to coherent structures, while others show perfect dislocations, resulting in semi-coherent interfaces.
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