Jove
Visualize
Contact Us

Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Enhancing eCHORD Orientation Mapping by Means of a Derivative Approach.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2025
Same author

A laser-based annealing methodology to speed-up the study of thermo-activated restoration mechanisms in metals.

The Review of scientific instruments·2025
Same author

Advanced Chemical and Imaging Methods for Studying Structure Morphology and Excipients Solid State Transformations in Pharmaceutical Multiparticulate Formulations.

Journal of pharmaceutical sciences·2024
Same author

Multimodal, broadly neutralizing antibodies against SARS-CoV-2 identified by high-throughput native pairing of BCRs from bulk B cells.

Cell chemical biology·2023
Same author

Boosted Spontaneous Formation of High-Aspect Ratio Nanopeaks on Ultrafast Laser-Irradiated Ni Surface.

Advanced science (Weinheim, Baden-Wurttemberg, Germany)·2022
Same author

Self-Organization Regimes Induced by Ultrafast Laser on Surfaces in the Tens of Nanometer Scales.

Nanomaterials (Basel, Switzerland)·2021
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: Jun 3, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Towards high accuracy calibration of electron backscatter diffraction systems.

Ken Mingard1, Austin Day, Claire Maurice

  • 1National Physical Laboratory, Hampton Road, Teddington, TW11 0LW, United Kingdom.

Ultramicroscopy
|March 15, 2011
PubMed
Summary
This summary is machine-generated.

Accurate Electron Backscatter Diffraction (EBSD) requires precise calibration. A new shadow-casting method determines the pattern centre (PC) to sub-pixel accuracy, improving EBSD measurements.

More Related Videos

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Related Experiment Videos

Last Updated: Jun 3, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Advanced Electron Backscatter Diffraction (EBSD) techniques are crucial for precise orientation and strain measurements.
  • Accurate calibration and reproducible measurement of system geometry are essential for EBSD.
  • Sub-pixel accuracy in determining the pattern centre (PC) is often required.

Purpose of the Study:

  • To highlight and quantify alignment and positioning problems in EBSD systems.
  • To address issues caused by the mechanical insertion/retraction of EBSD detector components.
  • To demonstrate a novel method for accurate pattern centre determination.

Main Methods:

  • Utilizing a novel shadow-casting technique.
  • Measuring optical alignment and lens distortion in the EBSD detector's scintillator, lens, and CCD camera.
  • Monitoring the pattern centre (PC) due to detector movement.

Main Results:

  • Quantified alignment and positioning issues in EBSD systems.
  • Demonstrated the determination of the pattern centre (PC) with high precision.
  • Achieved a precision of approximately 10μm or 1/3 CCD pixel for PC determination.

Conclusions:

  • The novel shadow-casting technique offers a precise solution for pattern centre determination in EBSD.
  • Accurate PC measurement is vital for reliable orientation and strain analysis using EBSD.
  • This method addresses critical calibration and alignment challenges in modern EBSD systems.