An FIB-SEM slice-and-view study of three-dimensional beta phase distribution in Ti-6Al-4V

In the scanning electron microscope, weak secondary electron contrast between the alpha and beta phases of a Ti-6Al-4V alloy can be improved via imaging conditions such as beam voltage and current. Dual beam focussed ion beam-scanning electron microscopes are thereby suited for characterising micron and sub-micron microstructural features of Ti-6Al-4V in three dimensions via serial-sectioning procedures.