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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
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Irreversible and reversible structural deformation and electromechanical behavior of carbon nanohorns probed by

Jianxun Xu1, Yoshitaka Shingaya, Hiroyuki Tomimoto

  • 1Nano Functionality Integration Group, International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan.

Small (Weinheim an Der Bergstrasse, Germany)
|March 25, 2011
PubMed
Abstract

No abstract available in PubMed .

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...