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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Electronic transport properties of In-doped ZnO nanobelts with different concentration

Jia Su1, Huifeng Li, Yunhua Huang

  • 1Department of Materials Physics and Chemistry, University of Science and Technology, Beijing, 100083, China.

Nanoscale
|March 30, 2011
PubMed

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