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Atomically Traceable Nanostructure Fabrication
Published on: July 17, 2015
Investigation on fabrication of nanoscale patterns using laser interference lithography
Jinnil Choi1, Myung-Ho Chung, Ki-Young Dong
1Display and Nanosystem Lab., College of Engineering, Korea University, Seoul 136-713, Korea.
Journal of Nanoscience and Nanotechnology
|March 31, 2011
Summary
Laser interference lithography (LIL) fabricates nanoscale patterns quickly over large areas without masks. This study optimizes LIL parameters for uniform dot and line structures on silicon substrates.
Area of Science:
- Materials Science
- Nanotechnology
- Optics
Background:
- Laser interference lithography (LIL) is a maskless technique for fabricating nanoscale patterns.
- Lloyd's mirror interferometer enables simple, large-area patterning.
- Understanding LIL parameter effects is crucial for optimizing nanoscale structure fabrication.
Purpose of the Study:
- To investigate the effects of key parameters on LIL for nanoscale pattern generation.
- To achieve uniform dot and line patterns with controlled dimensions.
- To optimize exposure time and material usage for LIL.
Main Methods:
- Utilized a Lloyd's mirror interferometer with a 257 nm wavelength laser.
- Investigated parameters including exposure dosage, beam intersection angle, and light source power.
- Employed positive photoresist DHK-BF424 on a silicon substrate.
- Applied bottom anti-reflective coating (DUV-30J) for line structure enhancement.
Main Results:
- Achieved uniform dot patterns (20 mm x 20 mm) with half pitch sizes of 190, 250, and 370 nm.
- Reduced exposure time to 12/12 sec by increasing beam power to 0.600 mW/cm2 for DHK-BF424 photoresist.
- Confirmed improvements in line structures using a bottom anti-reflective coating.
Conclusions:
- LIL is an effective maskless technology for large-area nanoscale patterning.
- Parameter optimization significantly influences pattern quality and fabrication efficiency.
- LIL offers advantages in speed and simplicity for creating nanoscale dot and line structures.

