Atomic Force Microscopy
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Updated: Jun 3, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
Published on: October 24, 2014
Kei Kobayashi1, Hirofumi Yamada, Kazumi Matsushige
1Office of Society-Academia Collaboration for Innovation, Kyoto University, Katsura, Nishikyo, Kyoto 615-8520, Japan. keicoba@iic.kyoto-u.ac.jp
Frequency noise in frequency modulation atomic force microscopy (FM-AFM) is reduced by increased effective Q-factor due to phase shifting elements. This improves quantitative force measurements in FM-AFM.
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