Electron Beam-Induced Current (EBIC) in solution-processed solar cells

Electron Beam-Induced Current (EBIC) measurements were used to produce 2D maps for investigating the homogeneity of solar cells. These maps are acquired by scanning the electron beam of a scanning electron microscope over a small area and using a programmable sample stage to move the solar cell under the scan area. The electron beam generates electron-hole pairs in the solar cell much like light does in normal solar cell operation. Solution-processed solar cells where the active layer consisted of purely inorganic or purely organic materials were measured. Since the electron beam irreversibly damages organic material, it was important to ensure that the measurements were made before the materials were altered.