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Updated: Jun 2, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
New mechanism for positronium formation on a silicon surface
D B Cassidy1, T H Hisakado, H W K Tom
1Department of Physics and Astronomy, University of California, Riverside, California 92521-0413, USA.
Abstract:
We describe experiments in which positronium (Ps) is emitted from the surface of p-doped Si(100), following positron implantation. The observed emission rate is proportional to a Boltzmann factor exp{-E(A)/kT}, which is dependent on the temperature T of the sample and a characteristic energy E(A)=(0.253±0.004) eV. Surprisingly, however, the Ps emission energy has a constant value of ∼0.16 eV, much greater than kT. This observation suggests the spontaneous emission of energetic Ps from a short-lived metastable state that becomes thermally accessible to available surface electrons once the positron is present. A likely candidate for this entity is an electron-positron state analogous to the surface exciton observed on p-Si(100) c(4×2) by Weinelt et al. [Phys. Rev. Lett. 92, 126801 (2004)].
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