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Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
Three-Dimensional Microscopy in Microbiology01:28

Three-Dimensional Microscopy in Microbiology

Three-dimensional imaging techniques are essential in cell biology, allowing researchers to visualize intricate cellular structures with high resolution. Two prominent methods, Differential Interference Contrast Microscopy (DIC) and Confocal Scanning Laser Microscopy (CSLM), provide distinct advantages for imaging live and thick specimens, respectively.Differential Interference Contrast MicroscopyDIC microscopy enhances contrast in transparent, unstained samples by converting phase...

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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Published on: July 5, 2016

Three-dimensional diffraction mapping by tuning the X-ray energy.

T W Cornelius1, D Carbone, V L R Jacques

  • 1European Synchrotron Radiation Facility, 6 rue Jules Horowitz, BP 220, 38043 Grenoble Cedex, France. thomas.cornelius@esrf.fr

Journal of Synchrotron Radiation
|April 29, 2011
PubMed
Summary
This summary is machine-generated.

Researchers mapped a silicon-germanium (SiGe) island using X-ray diffraction. This energy-tuning method improves nanostructure analysis and enables in situ studies with advanced microscopy.

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Nanotechnology

Background:

  • Characterizing nanostructures requires high-resolution diffraction techniques.
  • Conventional X-ray diffraction methods face limitations with small structures and vibrations.

Purpose of the Study:

  • To develop and validate an energy-tuning X-ray diffraction technique for analyzing single SiGe islands.
  • To overcome limitations of traditional methods for nanostructure characterization.

Main Methods:

  • Utilized a microfocused X-ray beam and compound refractive lenses for focusing.
  • Recorded three-dimensional reciprocal-space maps around the Si(004) Bragg peak.
  • Employed an energy-tuning technique for data acquisition.

Main Results:

  • The generated map accurately reflects simulated data.
  • The results align with maps obtained from conventional rocking-curve scans.
  • The energy-tuning method demonstrated robustness against instrumental vibrations.

Conclusions:

  • The energy-tuning technique provides a viable alternative for nanostructure analysis.
  • This method enhances the compatibility of X-ray diffraction with in situ environments like scanning probe microscopy.
  • Opens new avenues for advanced materials characterization at the nanoscale.