High-resolution stress mapping of polycrystalline alumina compression using synchrotron X-ray diffraction

Seetha Raghavan1, Peter Imbrie

  • 1University of Central Florida, Orlando, Florida, USA. sraghava@mail.ucf.edu

Summary

This study used synchrotron X-ray diffraction to map stress in a polycrystalline alumina sample during uniaxial compression. The results showed that stress was not uniform across the sample. The highest stress occurred at the sample-platen interface and at the corners of the specimen. These stress concentrations could lead to premature failure and affect the accuracy of stress measurements. The findings suggest that current assumptions about uniform stress in compression tests may be incorrect. This information can help improve compression testing protocols for ceramics.

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