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The de Broglie Wavelength
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Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
1OSIRES Optical Engineering, Schillerstrasse 19, D-98693 Ilmenau, Germany. jb@osires.biz
This study introduces a novel perturbation method to accelerate eigenvalue computations in modal diffraction techniques like rigorous coupled wave analysis (RCWA). The approach leverages existing eigensolution data for faster, reliable results in optical simulations.
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