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Updated: Jun 2, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
1Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201204, China. rongchang.chen@gmail.com
This study introduces a simplified absorption correction for x-ray phase retrieval, enabling material differentiation with single-distance phase-contrast computed tomography (PPCT) without prior sample knowledge.
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