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Ohmic drop compensation in voltammetry: iterative correction of the applied potential
1Department of Chemistry, Box 9573, Mississippi State, Mississippi 39762.
Analytical Chemistry
|May 31, 2011
Summary
A new digital method, iterative correction of the applied potential (ICAP), corrects ohmic potential drop in voltammetry. This technique improves high-speed electrochemical measurements by replacing analog feedback with digital processing.
Area of Science:
- Electrochemistry
- Analytical Chemistry
Background:
- Ohmic potential drop is a significant error source in voltammetric measurements.
- Traditional electronic positive feedback methods for correction have limitations, especially in high-speed experiments.
Purpose of the Study:
- To introduce and describe a novel digital method for ohmic potential drop correction.
- To demonstrate the effectiveness of the iterative correction of the applied potential (ICAP) method.
Main Methods:
- Development of the iterative correction of the applied potential (ICAP) procedure.
- Utilizing high-speed digital oscilloscopes to acquire voltammetric current data.
- Employing arbitrary waveform generators to synthesize compensating potential waveforms.
Main Results:
- ICAP effectively corrects for ohmic potential drop in voltammetry.
- The digital approach overcomes limitations associated with electronic positive feedback correction.
- The method is particularly advantageous for high-speed electrochemical measurements.
Conclusions:
- The iterative correction of the applied potential (ICAP) offers a robust digital alternative for ohmic drop correction.
- This method enhances the accuracy and reliability of voltammetric data, especially at high scan rates.
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