Phase Contrast and Differential Interference Contrast Microscopy
Atomic Force Microscopy
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Updated: Jun 1, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Tao Wu1, Jesus D Valera, Andrew J Moore
1School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh EH14 4AS, UK.
Exceed the velocity measurement limit in dynamic interferometry by unwrapping velocity data. This technique allows measuring surface velocities up to 4 times the Nyquist limit, enabling faster, more precise measurements.
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