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Fatigue testing of controlled memory wire nickel-titanium rotary instruments
Ya Shen1, Wei Qian, Houman Abtin
1Division of Endodontics, Department of Oral Biological and Medical Sciences, Faculty of Dentistry, The University of British Columbia, Vancouver, Canada.
Journal of Endodontics
|June 22, 2011
Summary
Controlled memory (CM) NiTi files demonstrate significantly improved fatigue resistance compared to conventional NiTi files. This novel alloy enhances fracture resistance, offering greater durability for dental instruments.
Area of Science:
- Materials Science
- Biomaterials Engineering
- Dental Materials
Background:
- Nickel-titanium (NiTi) files are crucial in endodontics.
- Improving fracture resistance of NiTi files is a key manufacturing goal.
- Novel alloys and manufacturing processes are being developed for enhanced NiTi file performance.
Purpose of the Study:
- To evaluate the fatigue behavior of NiTi instruments manufactured from a novel controlled memory NiTi wire (CM Wire).
- To compare the fatigue performance of CM Wire instruments against conventional NiTi files.
Main Methods:
- Rotational bending tests were performed on various NiTi instruments (ProFile, Typhoon, Typhoon CM, NEYY, NEYY CM) at 35° and 45° curvatures.
- The number of revolutions to fracture (N(f)) was recorded.
- Fracture surfaces were analyzed using scanning electron microscopy to assess crack initiation sites and dimple area percentages.
Main Results:
- CM Wire instruments exhibited a 3-to-8-fold increase in N(f) compared to conventional NiTi files (P < .05).
- CM instruments predominantly showed multiple crack origins (50%-92%), unlike conventional files (58%-100%) which typically had one.
- Dimple area fractions were significantly smaller in CM NiTi instruments (P < .01).
- Instrument configuration (square vs. triangular) significantly impacted lifetime on CM wire at both curvatures (P < .01).
Conclusions:
- Material properties, specifically the use of CM Wire, substantially influence fatigue lifetime.
- NiTi instruments made from CM Wire demonstrate significantly higher N(f) and lower surface strain amplitude than conventional NiTi wire files with identical designs.

