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Published on: December 1, 2020
Joint structure refinement of x-ray and neutron diffraction data on disordered materials: application to liquid water
1ISIS Facility, Rutherford Appleton Laboratory, Chilton, Didcot, Oxon OX11 0QX, UK.
Summary
Combining X-ray and neutron diffraction data for liquid water reveals structural insights. A softer core potential is proposed, improving models of water
Area of Science:
- Materials Science
- Condensed Matter Physics
- Physical Chemistry
Background:
- X-ray diffraction provides structural data for liquids and solids, complementing neutron diffraction.
- X-ray scattering from electrons is complicated by Q-dependent form factors, especially in polarized molecules like water.
- Empirical Potential Structure Refinement (EPSR) is used to reconcile X-ray and neutron diffraction data.
Purpose of the Study:
- To develop a single atomistic structural model consistent with both X-ray and neutron diffraction data for liquid water.
- To investigate the constraints X-ray diffraction data place on structural models of water.
- To refine understanding of water's molecular structure and hydrogen bonding.
Main Methods:
- Utilizing Empirical Potential Structure Refinement (EPSR) to model liquid water.
- Analyzing X-ray diffraction data with varying Q-ranges (up to ~17.0 Å⁻¹).
- Analyzing neutron diffraction data with extended Q-ranges (up to ~30 Å⁻¹).
Main Results:
- X-ray data strongly constrain water's structural models but limited Q-ranges and data variations prevent precise determination of the OO radial distribution function's first peak.
- Neutron data, despite high Q-ranges, introduce minor uncertainties in hydrogen bond peak positions.
- Combined data suggest classical water potentials may have overly repulsive short-distance cores.
Conclusions:
- Simultaneous analysis of X-ray and neutron diffraction data refines structural models of liquid water.
- A softer core potential is proposed for water models to better represent short-range interactions.
- Accurate structural modeling requires careful consideration of diffraction data limitations and potential deviations in electronic form factors.
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