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Updated: May 31, 2026

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Yanghong Wang1, Dan Thomas, Ping Zhang
1Department of Mechanical Engineering, Oakland University, Rochester, MI 48309, USA.
A novel Digital Speckle Pattern Interferometry (DSPI) system enables accurate 3D strain characterization on complex surfaces. This advancement overcomes limitations of current systems for intricate geometries in engineering applications.
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