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Updated: May 31, 2026

In Situ Measurement of Vacuum Window Birefringence using 25Mg+ Fluorescence
Published on: June 13, 2020
Note: mounting ultra-high vacuum windows with low stress-induced birefringence
Neal Solmeyer1, Kunyan Zhu, David S Weiss
1104 Davey Laboratory, The Pennsylvania State University, University Park, Pennsylvania 16802, USA.
Abstract:
We have developed a way to mount ultra-high vacuum windows onto standard ConFlat(®) vacuum systems with very low stress-induced birefringence. Each window is sealed to a stainless steel flange with a compressed indium wire, and that flange is connected to a vacuum chamber with another indium seal. We find that deformation of a standard ConFlat flange during indium sealing dominates the stress on the window, so an extra-rigid flange is needed for minimal birefringence. With this mounting scheme, the typical residual birefringence is Δn = 2.3 × 10(-7) and is unchanged by a 120 °C bake.

