SiGe nanowire growth and characterization

Single-crystal SiGe nanowires were synthesized via the vapour-liquid-solid (VLS) growth mechanism using disilane and germane as precursor gases. We have investigated the effect of temperature, pressure, and the inlet gas ratio on the growth and stoichiometry of Si(x)Ge(1-x) nanowires. The nanowires were characterized using scanning and transmission electron microscopies and energy dispersive x-ray analysis. It was found that nanowires with a Si:Ge ratio of about 1 had smooth surfaces, whereas departure from this ratio led to rough surfaces. Electrical properties were then investigated by fabricating back-gated field effect transistors (using a focused ion beam system) where single SiGe nanowires served as the conduction channels. Gated conduction was observed although resistance in the undoped devices was high.