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Related Concept Videos

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
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Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Scanning Transmission Electron Microscopy Tomography in Virology: 3D Imaging of High-pressure Frozen, Freeze-substituted Samples
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Scanning Transmission Electron Microscopy Tomography in Virology: 3D Imaging of High-pressure Frozen, Freeze-substituted Samples

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Scanning transmission electron microscopy imaging dynamics at low accelerating voltages.

N R Lugg1, S D Findlay, N Shibata

  • 1School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia.

Ultramicroscopy
|July 12, 2011
PubMed
Summary
This summary is machine-generated.

Researchers explored how lower electron beam energies affect scanning transmission electron microscopy (STEM) imaging. This study investigates electron channelling and inelastic interactions at reduced accelerating voltages to minimize damage to beam-sensitive specimens.

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Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy
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Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy

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Last Updated: May 31, 2026

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Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy
10:29

Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy

Published on: February 5, 2017

Area of Science:

  • Materials Science
  • Physics
  • Electron Microscopy

Background:

  • Beam-sensitive specimens require reduced electron dose for imaging.
  • Scanning transmission electron microscopy (STEM) is a powerful tool for nanoscale analysis.
  • Lower accelerating voltages (<100 kV) are increasingly used in STEM to minimize specimen damage.

Purpose of the Study:

  • To investigate the impact of varying accelerating voltages on STEM imaging dynamics.
  • To understand electron channelling and inelastic scattering variations with accelerating voltage.
  • To provide insights for optimizing low-voltage STEM imaging of delicate materials.

Main Methods:

  • Simulations and/or experimental analysis of electron beam interactions.
  • High-angle annular-dark field (HAADF) imaging.
  • Electron energy loss spectroscopy (EELS) imaging.
  • Annular bright field (ABF) imaging.

Main Results:

  • Electron channelling patterns exhibit voltage-dependent changes.
  • Inelastic scattering cross-sections are altered at lower accelerating voltages.
  • Image contrast and resolution in HAADF, EELS, and ABF modes are affected by accelerating voltage.

Conclusions:

  • Lower accelerating voltages in STEM alter electron beam dynamics and imaging characteristics.
  • Understanding these variations is crucial for effective low-voltage STEM operation.
  • This research supports the development of advanced microscopy techniques for sensitive samples.