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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Limits in detecting an individual dopant atom embedded in a crystal.

Anudha Mittal1, K Andre Mkhoyan

  • 1Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, USA.

Ultramicroscopy
|July 12, 2011
PubMed
Summary

Annular dark field scanning transmission electron microscopy (ADF-STEM) can detect single dopant atoms. Optimal conditions for imaging dopant atoms depend on various factors, guiding experimental detection and localization.

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