Related Experiment Video
Updated: May 30, 2026

10:28
Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Simultaneous multidimensional deformation measurements using digital holographic moiré.
Gannavarpu Rajshekhar1, Sai Siva Gorthi, Pramod Rastogi
1Applied Computing and Mechanics Laboratory, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland.
Applied Optics
|July 21, 2011
Summary
This study introduces a novel digital holographic interferometry method for measuring object displacements. The technique simultaneously captures in-plane and out-of-plane deformations using multi-directional illumination and a single reference beam.
Area of Science:
- Optics and Photonics
- Experimental Mechanics
- Metrology
Background:
- Digital holographic interferometry (DHI) is a powerful technique for deformation analysis.
- Accurate measurement of both in-plane and out-of-plane displacements is crucial in many engineering applications.
- Existing DHI methods may face limitations in simultaneously capturing multi-directional displacement information.
Purpose of the Study:
- To develop and demonstrate a novel DHI technique for simultaneous measurement of in-plane and out-of-plane displacements.
- To enhance the capability of DHI for comprehensive deformation analysis of objects.
- To provide a robust method for extracting multi-phase information from interference patterns.
Main Methods:
- Simultaneous illumination of the object from multiple directions with a single reference beam.
- Numerical reconstruction of complex object wave-fields for pre- and post-deformation states.
- Generation of moiré interference fringe patterns from reconstructed complex amplitudes.
- Phase extraction using spatial carrier introduction and Fourier transform analysis.
Main Results:
- Successfully demonstrated simultaneous measurement of in-plane and out-of-plane displacements.
- Developed a method to extract multiple phase values from moiré fringes.
- Validated the accuracy of displacement measurement through sensitivity vector analysis.
Conclusions:
- The proposed DHI technique offers an elegant and effective solution for simultaneous displacement measurement.
- This method enhances the comprehensiveness of deformation analysis in optical metrology.
- The technique has potential applications in non-destructive testing and structural health monitoring.

