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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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U-shaped switches for optical information processing at the nanoscale

Ventsislav K Valev1, Alejandro V Silhanek, Ben De Clercq

  • 1Molecular Electronics and Photonics, INPAC, Katholieke Universiteit Leuven, Leuven, Belgium. v.k.valev@fys.kuleuven.be

Small (Weinheim an Der Bergstrasse, Germany)
|July 28, 2011
PubMed
Summary

No abstract available in PubMed .

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