Related Experiment Video
Updated: May 30, 2026

Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries
Published on: April 22, 2013
Ion beam triangulation based on electron detection for studies on the structure of 1 ML Mn on Cu(001)
T Bernhard1, J Seifert, H Winter
1Institut für Physik der Humboldt-Universität zu Berlin, Newtonstraße 15, D-12489 Berlin-Adlershof, Germany.
Abstract:
Recent developments in studies on the structure of surfaces based on ion beam triangulation are discussed. We will outline recent experimental progress in the application of this method, which is closely related to the detection of the number of emitted electrons per incident ion during scattering under surface channeling conditions. Key features are the pronounced change of electron emission for the projectile beam aligned along a low index crystallographic direction in the surface plane ('axial surface channeling') and the interpretation of data in terms of classical trajectory computer simulations. As a representative example we will discuss here studies on the structure of the low temperature c(8 × 2) Mn/Cu(001) phase.
Related Concept Videos
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Transmission Electron Microscopy
Overview of Electron Microscopy
