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Trapped charge dynamics in a sol-gel based TiO(2) high- k gate dielectric silicon metal-oxide-semiconductor field

M Ziaur Rahman Khan1, D G Hasko, M S M Saifullah

  • 1Nanoscience Centre, University of Cambridge, J J Thomson Avenue, Cambridge CB3 0FF, UK.

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|August 10, 2011
PubMed

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