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IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Infrared (IR) Spectroscopy: Overview01:09

Infrared (IR) Spectroscopy: Overview

When electromagnetic radiation passes through a material, atoms or molecules transition from a lower to a higher energy state by absorbing radiation corresponding to the energy difference between the two states. The absorption of infrared (IR) radiation causes transitions between vibrational energy levels in a molecule. Therefore, IR spectroscopy is a useful analytical tool for determining the molecular structure of molecules.
Different compounds display unique properties due to their...
Phase Contrast and Differential Interference Contrast Microscopy01:26

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
IR Spectrum Peak Splitting: Symmetric vs Asymmetric Vibrations01:08

IR Spectrum Peak Splitting: Symmetric vs Asymmetric Vibrations

Identical bonds within a polyatomic group can stretch symmetrically (in-phase) or asymmetrically (out-of-phase). Similar to hydrogen bonding, these vibrations also influence the shape of the IR peak. Generally, asymmetric stretching frequencies are higher than symmetric stretching frequencies. For example, primary amines exhibit two distinct IR peaks between 3300–3500 cm−1 corresponding to the symmetric and asymmetric N-H stretching, while secondary amines exhibit a single stretching vibration...

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Related Experiment Video

Updated: May 30, 2026

A Multimodal Wide-Field Fourier-Transform Raman Microscope
06:48

A Multimodal Wide-Field Fourier-Transform Raman Microscope

Published on: December 30, 2025

Laterally chromatically dispersed, spectrally encoded interferometer.

Marc Gronle1, Wolfram Lyda, Florian Mauch

  • 1Institut für Technische Optik, University Stuttgart, Stuttgart, Germany. gronle@ito.uni‐stuttgart.de

Applied Optics
|August 12, 2011
PubMed
Summary
This summary is machine-generated.

A novel single-shot line sensor uses spectral interferometry to capture surface height profiles. This innovative optical sensing technology achieves high-resolution measurements efficiently.

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Area of Science:

  • Optics and Photonics
  • Metrology
  • Surface Characterization

Background:

  • Accurate surface profiling is crucial in manufacturing and research.
  • Existing methods may lack speed or resolution for certain applications.

Purpose of the Study:

  • To introduce a single-shot line sensor for rapid surface height profile acquisition.
  • To demonstrate the sensor's capability using spectral interferometry.

Main Methods:

  • Utilizing a broadband laser source and a grating for chromatic dispersion.
  • Focusing dispersed light onto a surface line, creating wavelength-specific focal points.
  • Applying phase evaluation algorithms and a model-based approach to interference signals.

Main Results:

  • Successfully registered interference signals from the spectral line sensor.
  • Obtained complete surface height profiles through data processing.
  • Experimental validation confirmed the sensor's effectiveness.

Conclusions:

  • The developed spectral interferometry sensor enables efficient, single-shot surface profiling.
  • This technology offers a promising approach for advanced metrology applications.