Optimization of nanoelectronic systems' reliability under massive defect density using cascaded R-fold modular

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A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
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A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics

Published on: August 28, 2018

M Stanisavljevic1, A Schmid, Y Leblebici

  • 1Microelectronic Systems Laboratory (LSM), Swiss Federal Institute of Technology (EPFL), CH-1015 Lausanne, Switzerland.

Nanotechnology
|August 13, 2011
PubMed

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