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Updated: May 30, 2026

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
08:51

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography

Published on: May 27, 2008

Characterisation of internal morphologies in electrospun fibers by X-ray tomographic microscopy

Jens Vinge Nygaard1, Tamer Uyar, Menglin Chen

  • 1Aarhus School of Engineering (ASE), Aarhus University, Ny Munkegade, 8000 Aarhus C, Denmark. jvn@iha.dk

Nanoscale
|August 16, 2011
PubMed

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