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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
Atom world based on nano-forces: 25 years of atomic force microscopy
1Graduate School of Engineering, Osaka University, Yamada-Oka 2-1, 565-0871, Japan. smorita@eei.eng.osaka-u.ac.jp
Journal of Electron Microscopy
|August 17, 2011
Summary
Scanning tunneling microscopy (STM) allows atomic manipulation for nanostructure creation. Atomic force microscopy builds on this, utilizing nanoscale forces for new atomic exploration.
Area of Science:
- Nanotechnology
- Surface Science
- Atomic Physics
Background:
- Scanning tunneling microscopy (STM) pioneered atomic-scale imaging and manipulation.
- STM enabled the creation of nanostructures through bottom-up, atom-by-atom assembly.
- Atomic force microscopy (AFM) represents a subsequent advancement in atomic-scale investigation.
Purpose of the Study:
- To highlight the evolution of scanning probe microscopy.
- To introduce STM as a foundational atomic manipulation tool.
- To position AFM as a next-generation tool for exploring the atomic world.
Main Methods:
- Utilizing scanning tunneling microscopy (STM) for atomic imaging and manipulation.
- Employing atom-by-atom manipulation techniques for nanostructure fabrication.
- Leveraging nanoscale forces with atomic force microscopy (AFM).
Main Results:
- STM provides unprecedented capabilities for imaging, evaluating, and manipulating individual atoms.
- Atom-by-atom manipulation with STM facilitates the construction of artificial nanostructures.
- AFM extends atomic-scale exploration by utilizing interactions based on nanoscale forces.
Conclusions:
- STM is a first-generation atomic tool enabling precise nanostructure engineering.
- AFM, a second-generation tool, expands the possibilities of atomic-scale research using force interactions.
