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Updated: May 30, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Quantum critical point in SmO(1-x)F(x)FeAs and oxygen vacancy induced by high fluorine dopant
Jie Cheng1, Shengqi Chu, Wangsheng Chu
1National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China.
Abstract:
The local lattice and electronic structure of the high-T(c) superconductor SmO(1-x)F(x)FeAs as a function of F-doping have been investigated by Sm L(3)-edge X-ray absorption near-edge structure and multiple-scattering calculations. Experiments performed at the L(3)-edge show that the white line (WL) is very sensitive to F-doping. In the under-doped region (x ≤ 0.12) the WL intensity increases with doping and then it suddenly starts decreasing at x = 0.15. Meanwhile, the trend of the WL linewidth versus F-doping levels is just contrary to that of the intensity. The phenomenon is almost coincident with the quantum critical point occurring in SmO(1-x)F(x)FeAs at x ≃ 0.14. In the under-doped region the increase of the intensity is related to the localization of Sm-5d states, while theoretical calculations show that both the decreasing intensity and the consequent broadening of linewidth at high F-doping are associated with the content and distribution of oxygen vacancies.
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