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Updated: May 30, 2026
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
High contrast magnetic and nonmagnetic sample current microscopy for bulk and transparent samples using soft X-rays.
Daniela Nolle1, Markus Weigand, Gisela Schütz
1MPI for Metals Research, Department of Modern Magnetic Materials, Heisenbergstrasse 3, 70569 Stuttgart, Germany. nolle@mf.mpg.de
Summary
Total electron yield (TEY) microscopy enables X-ray imaging of bulk magnetic materials. This technique overcomes limitations of transmission microscopy, revealing surface morphology details and magnetic properties of nontransparent samples.
Area of Science:
- Materials Science
- Surface Science
- X-ray Microscopy
Background:
- Soft X-rays offer unique detection capabilities for material systems and magnetic imaging via X-ray magnetic circular dichroism.
- Transmission microscopy is limited by the short penetration depth of soft X-rays, requiring thinned samples.
- Photoelectron emission microscopy allows bulk sample investigation but is restricted to small magnetic fields and smooth surfaces.
Purpose of the Study:
- To present total electron yield (TEY) microscopy results for investigating bulk magnetic materials under high magnetic fields.
- To demonstrate the capabilities of TEY microscopy for imaging nontransparent samples, overcoming limitations of other techniques.
Main Methods:
- Utilized total electron yield (TEY) microscopy with total sample current detection.
- Performed measurements at the ultra-high vacuum scanning microscope "MAXYMUS" at HZB/BESSY II.
- Conducted synchronous measurements in TEY and transmission modes for comparison.
Main Results:
- TEY microscopy revealed high absorption contrast and 3D-like edge enhancement, similar to scanning electron microscopy.
- The technique successfully imaged surface morphology details at the smallest length scales.
- Surface-sensitive in- and out-of-plane magnetic TEY measurements were performed on nontransparent samples.
Conclusions:
- Total electron yield (TEY) microscopy is a powerful technique for X-ray microscopic investigation of bulk magnetic materials.
- This method overcomes sample thickness limitations and enables magnetic imaging under high fields.
- TEY microscopy provides detailed insights into surface morphology and magnetic properties of nontransparent samples.
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